Irtron Micro Sample Compartment Microscope for FTIR
Date Posted: Monday, August 21, 2006
Jasco has announced the launch of Irtronµ sample compartment microscopy system, designed to provide analysis of microscopic samples with the high performance features of an external FT-IR microscope accessory.
The Irtronµ is compatible with the Jasco FT/IR-4000 and 6000 Series FT-IR instruments.
The microscope accessory installs into the spectrometer sample compartment without optical alignment.
The Irtron micro can be operated with the integrated touch panel or via a PC using the Spectra Manager software interface.
The sample is observed with the integrated color CCD camera and 5 inch TFT color LCD monitor.
Jasco's ATOS (Aperture Through Optical System) is designed to provide simultaneous viewing of the sample image and sampling location specified by the aperture.
An option within the Spectra Manager control package allows auto-saving of the collected spectra as well as the sample image(s).
Three measurement modes are available; Transmittance, Reflectance, and ATR.
Three types of optional ATR objectives are available, selecting from ZnSe, Ge, and Diamond crystal elements. An optional pressure sensor to protect the ATR elements is also available.
To measure a variety of samples without removing the microscope accessory, optional sample holders for powders or liquid samples are available.
The liquid sample holder is provided with three standard spacers, providing 0.1, 0.05 and 0.025 mm pathlengths for liquid sample analyses.
The powder sample holder can be used for diffuse reflectance measurements of powdered samples mixed with KBr, up to five samples can be loaded onto the holder.
The Irtronµ can be used with the standard DLATGS instrument detector, providing the full mid-IR spectral range from 4000 - 400 cm-1 for samples 100 microns or greater.
For sensitivity and samples approaching 20 microns, an optional MCT detector is recommended, which can be installed in the standard instrument.
Alternatively, NIR optimized detectors such as InGaAs and/or InSb are also available.
Jasco's Smart-View function allows sample observation during measurement. This function allows selection of the best sample position while monitoring the IR spectrum in real-time.
The standard purge casing can be used to eliminate interferences from the CO2 and water vapor bands.
Further Information: http://www.jascoinc.com
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